7BMS

HEWL in cesium chloride (1.5 M CsCl in crystallization condition and cryo protectant)


X-RAY DIFFRACTION

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
1VAPOR DIFFUSION, HANGING DROP4.5293.1550 mM sodium acetate pH 4.5, 1.5 M cesium chloride
Crystal Properties
Matthews coefficientSolvent content
1.831.5

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 75.928α = 90
b = 75.928β = 90
c = 35.707γ = 90
Symmetry
Space GroupP 43 21 2

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11x-ray100PIXELDECTRIS PILATUS3 6M2016-07-22MSINGLE WAVELENGTH
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1SYNCHROTRONESRF BEAMLINE ID291.71075ESRFID29

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)R Merge I (Observed)Rrim I (All)Rpim I (All)CC (Half)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
11.7537.9699.60.1570.1610.0330.99618.320.310988
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)R Merge I (Observed)Rrim I (All)Rpim I (All)CC (Half)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
11.751.7895.20.4210.4540.1660.9027.4

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodResolution (High)Resolution (Low)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (Observed)R-WorkR-FreeR-Free Selection DetailsMean Isotropic B
X-RAY DIFFRACTIONSADTHROUGHOUT1.7537.961037058399.50.17660.17480.2093RANDOM16.969
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
0.560.56-1.11
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg35.327
r_dihedral_angle_4_deg23.489
r_dihedral_angle_3_deg15.295
r_dihedral_angle_1_deg6.131
r_angle_refined_deg2.005
r_angle_other_deg1.255
r_chiral_restr0.156
r_bond_refined_d0.028
r_gen_planes_refined0.01
r_bond_other_d0.004
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg35.327
r_dihedral_angle_4_deg23.489
r_dihedral_angle_3_deg15.295
r_dihedral_angle_1_deg6.131
r_angle_refined_deg2.005
r_angle_other_deg1.255
r_chiral_restr0.156
r_bond_refined_d0.028
r_gen_planes_refined0.01
r_bond_other_d0.004
r_gen_planes_other0.003
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms1000
Nucleic Acid Atoms
Solvent Atoms131
Heterogen Atoms24

Software

Software
Software NamePurpose
XDSdata scaling
REFMACrefinement
PDB_EXTRACTdata extraction
PHASERphasing
XDSdata reduction