5TIS
Room temperature XFEL structure of the native, doubly-illuminated photosystem II complex
X-RAY DIFFRACTION
Starting Model(s)
Initial Refinement Model(s) | |||
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Type | Source | Accession Code | Details |
experimental model | PDB | 5KAI |
Crystallization
Crystalization Experiments | ||||
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ID | Method | pH | Temperature | Details |
1 | BATCH MODE | 6.5 | 293 | Crystal growth was as described in Kern et al. 2005, Biochim. Biophys. Acta-Bioenergetics and Ibrahim et al. 2015, Struct. Dyn. 2 (4), 041705, substituting C12E8 for beta-DM and Betaine for glycerol |
Crystal Properties | |
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Matthews coefficient | Solvent content |
3.46 | 64.49 |
Crystal Data
Unit Cell | |
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Length ( Å ) | Angle ( ˚ ) |
a = 117.87 | α = 90 |
b = 223.14 | β = 90 |
c = 310.71 | γ = 90 |
Symmetry | |
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Space Group | P 21 21 21 |
Diffraction
Diffraction Experiment | ||||||||||||||
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ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
1 | 1 | x-ray | 293 | CCD | RAYONIX MX170-HS | Compound refractive lenses | 2015-11-18 | M | SINGLE WAVELENGTH | |||||
2 | 1 | x-ray | 293 | CCD | RAYONIX MX170-HS | Compound refractive lenses | 2016-07-14 | M | SINGLE WAVELENGTH |
Radiation Source | |||||
---|---|---|---|---|---|
ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
1 | FREE ELECTRON LASER | SLAC LCLS BEAMLINE XPP | 1.3051 | SLAC LCLS | XPP |
2 | FREE ELECTRON LASER | SLAC LCLS BEAMLINE MFX | 1.3051 | SLAC LCLS | MFX |
Data Collection
Overall | |||||||||||||||||||
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | CC (Half) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | ||||||||
1 | 2.25 | 44.28 | 99.98 | 0.974 | 19.834 | 158.47 | 385545 | 42.9839105609 |
Highest Resolution Shell | |||||||||||||||||||
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | CC (Half) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | |||||||||||
2.25 | 2.289 | 99.98 | 0.018 | 2.036 | 10.37 |
Refinement
Statistics | |||||||||||||||||||
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Diffraction ID | Structure Solution Method | Cross Validation method | Starting model | Resolution (High) | Resolution (Low) | Cut-off Sigma (F) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work | R-Free | R-Free Selection Details | Mean Isotropic B | |||||
X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | FREE R-VALUE | 5KAI | 2.25000371562 | 44.2766212822 | 1.32535968968 | 385545 | 3426 | 99.933385519 | 0.193550152737 | 0.193214944928 | 0.230881600007 | Random selection w.r.t. complete reflections to 2 Angstroms | 47.7620084464 |
Temperature Factor Modeling | ||||||
---|---|---|---|---|---|---|
Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
RMS Deviations | |
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Key | Refinement Restraint Deviation |
f_dihedral_angle_d | 14.9024531457 |
f_angle_d | 0.503129489462 |
f_chiral_restr | 0.0382482334883 |
f_bond_d | 0.00571882994341 |
f_plane_restr | 0.00393061979526 |
Non-Hydrogen Atoms Used in Refinement | |
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Non-Hydrogen Atoms | Number |
Protein Atoms | 41719 |
Nucleic Acid Atoms | |
Solvent Atoms | 1179 |
Heterogen Atoms | 8659 |
Software
Software | |
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Software Name | Purpose |
cctbx.xfel | data reduction |
PHASER | phasing |
PHENIX | refinement |